EMBEDDED SYSTEM

1.
Suppose the pictured processor has added, along with the carry flag, a
flag to indicate if the output of the ALU is 0 and a flag to indicate if the
output of the ALU is positive or negative. Write a program to input and store
three integers, I, J, and X. Include a subroutine to compute I + J and I - J.
Then in the main program do the following: if X > 0, output I + J. If X <
0, output I – J. If X = 0, output 0.

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the link below for question 1 detail

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2.
a. Construct a truth table for a “full subtractor”. Then write a
complete, well-documented Verilog program to implement your subtractor.

b. Write a thorough but efficient testbench
for your subtractor program.

3.
a. Write a Verilog program to implement the pictured fsm. Assume that
in S1 the fsm outputs 1, in S2, the fsm output 2, and in S3, the fsm outputs 3.

b.
Write a
thorough but efficient testbench to test your fsm.

c.
Is this
fsm a Moore machine or a Mealey machine? Explain.

4.
a.
Compute the sum in each case. Does overflow occur? Why or why not?

i.
011 + 011
=? overflow? Explain.

ii.
111 + 111 =? Overflow? Explain.

iii.
011 +
111=? Overflow? Explain.

b.
If we add 0?? And 1??, what values can be assigned to the unknown
digits to give overflow? Explain.

c.
In fixed
point notation, what range of values can X represent if X = 011101?

d.
What are
the three fields for a number represented in floating point notation?

i.
_______________________________
ii.________________________________iii.________________________________

e.
For
floating point numbers, define NaN.

f.
If you are designing a processor, how will you decide whether or not
to include floating point arithmetic?

5.
a. What is the difference between a von Neumann architecture and a
Harvard architecture? b. How do you decide which type of architecture in a is
best for a given processor?

c. Define the following terms:

i.
Nyquist frequency ii. legacy code

iii. real-time system

iv. trust

6. a. What does CMM stand for and why is it
important?

b. Give two methods you could use as part of a
“design for testability” strategy.

c.
Give two
reasons to use scan testing to test an IC.

d.
What are
two safety features which could be included in a traffic light system? Explain.

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